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Proceedings Paper

Optical investigations of polyethylene microporous films during the structure formation process
Author(s): Galina C. Elyashevich; Alexander G. Kozlov; Ivanka T. Moneva; Alexander A. Zinchik; Alexander V. Smirmov; Sergey C. Stafeev
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Paper Abstract

The structural investigations at each stage of the structure formation process--melt extrusion, annealing, and uniaxial extension--have been carried out for polyethylene microporous samples by light scattering, small-angle X-ray scattering, and birefringence techniques. The birefringence values (Delta) n have been calculated from the angular dependences of the transmitted polarized light intensity. The dependences of (Delta) n on the orientation degree (lambda) have been obtained. The basic characteristics of the crystalline structure and their changes at each stage of the process have been determined by the X-ray technique. Light scattering pictures have been obtained for microporous films using a laser with the wavelength of 633 nm. These pictures are characterized by a specific type of symmetry and differ from any patterns typical for oriented crystallizable polymers. It is found that similar pictures are observed for all porous samples regardless of their orientation degree. So it is possible to make a conclusion that the characteristic size calculated from the light scattering patterns may be regarded as one of the main topological parameters describing the disposition of pores as the scattering elements.

Paper Details

Date Published: 19 August 1998
PDF: 4 pages
Proc. SPIE 3573, OPTIKA '98: 5th Congress on Modern Optics, (19 August 1998); doi: 10.1117/12.320949
Show Author Affiliations
Galina C. Elyashevich, Institute of Macromolecular Compounds (Russia)
Alexander G. Kozlov, Institute of Macromolecular Compounds (Russia)
Ivanka T. Moneva, Institute of Polymers (Bulgaria)
Alexander A. Zinchik, State Institute of Fine Mechanics and Optics (Russia)
Alexander V. Smirmov, State Institute of Fine Mechanics and Optics (Russia)
Sergey C. Stafeev, State Institute of Fine Mechanics and Optics (Russia)

Published in SPIE Proceedings Vol. 3573:
OPTIKA '98: 5th Congress on Modern Optics
Gyorgy Akos; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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