Share Email Print
cover

Proceedings Paper

High-temperature pressure transducer interface
Author(s): Paul C. de Jong; Gerard C. M. Meijer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper describes a high-temperature (250 degree(s)C) pressure-transducer interface for resistive Wheatstone bridges. The long-term drift of the smart sensor, i.e., the (pressure) sensor plus its interface electronics, will be determined by the drift of the sensor only. A continuous three-signal auto-calibration sequence of the interface electronics keeps the transducer interface virtually free of long-term drift. A patented low-drift pre-amplifier forms an essential element in this system. The high-temperature operation of the transducer interface has been investigated from both an electronic and a packaging point of view. The system has been realized by combining CMOS ASICs with a thick-film packaging technology. The pressure-transducer interface works up to 250 - 275 degree(s)C with 15 - 16 bits accuracy.

Paper Details

Date Published: 20 July 1998
PDF: 12 pages
Proc. SPIE 3328, Smart Structures and Materials 1998: Smart Electronics and MEMS, (20 July 1998); doi: 10.1117/12.320180
Show Author Affiliations
Paul C. de Jong, Delft Univ. of Technology (Netherlands)
Gerard C. M. Meijer, Delft Univ. of Technology (Netherlands)


Published in SPIE Proceedings Vol. 3328:
Smart Structures and Materials 1998: Smart Electronics and MEMS
Vijay K. Varadan; Paul J. McWhorter; Richard A. Singer; Michael J. Vellekoop, Editor(s)

© SPIE. Terms of Use
Back to Top