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Proceedings Paper

2D wavelet transform with different adaptive wavelet bases for texture defect inspection based on genetic algorithm
Author(s): Hong Liu; Yu Long Mo
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Paper Abstract

There are many textures such as woven fabrics having repeating Textron. In order to handle the textural characteristics of images with defects, this paper proposes a new method based on 2D wavelet transform. In the method, a new concept of different adaptive wavelet bases is used to match the texture pattern. The 2D wavelet transform has two different adaptive orthonormal wavelet bases for rows and columns which differ from Daubechies wavelet bases. The orthonormal wavelet bases for rows and columns are generated by genetic algorithm. The experiment result demonstrate the ability of the different adaptive wavelet bases to characterize the texture and locate the defects in the texture.

Paper Details

Date Published: 19 August 1998
PDF: 7 pages
Proc. SPIE 3561, Electronic Imaging and Multimedia Systems II, (19 August 1998); doi: 10.1117/12.319751
Show Author Affiliations
Hong Liu, Shanghai Univ. of Science and Technology (China)
Yu Long Mo, Shanghai Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 3561:
Electronic Imaging and Multimedia Systems II
LiWei Zhou; Chung-Sheng Li, Editor(s)

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