Share Email Print
cover

Proceedings Paper

Noise compensation method study on APD photoelectronic detector
Author(s): Dianren Chen; Huilin Jiang; Guiying Li
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The noise compensation method of APD photoelectronic sensor C30950E is studied in this paper. The noise theory and the compensation method of the constant false alarm rate are introduced, an APD noise compensation method controlled by a single chip microprocessor AT89C2051 is given.

Paper Details

Date Published: 19 August 1998
PDF: 4 pages
Proc. SPIE 3547, Semiconductor Lasers III, (19 August 1998); doi: 10.1117/12.319620
Show Author Affiliations
Dianren Chen, Changchun Institute of Optics and Fine Mechanics (China)
Huilin Jiang, Changchun Institute of Optics and Fine Mechanics (China)
Guiying Li, Changchun Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 3547:
Semiconductor Lasers III
Qiming Wang; Lawrence J. Davis; Siamak Forouhar, Editor(s)

© SPIE. Terms of Use
Back to Top