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Proceedings Paper

Most-suitable nonuniformity correction method for PtSi SBD detector
Author(s): Yasujiro Kiyota
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Paper Abstract

Currently, there are several kinds of infrared imaging system with 2D detector using PtSi, InSb, MCT and any others in the commercial market. The infrared imaging system with 2D detector is generally required to correct non-uniformity of response of each pixel in order to display satisfactory infrared images. This non-uniformity correction is normally performed digitally after an ADC. Furthermore, this operation should be finished within a field time, therefore it must work correspondingly fast. PtSi detector has non- linear Input/Output characteristics because of their spectral response characteristics. Therefore, two point gain/offset correction is not suitable for non-linear characteristics detector. This paper reports on three alternate methods for non-uniformity correction for PtSi detector. These methods are actually tested and then the uniformity performances after these corrections are measured. The standard deviation of the residual fixed pattern noise is used to evaluate the performance of non- uniformity correction.

Paper Details

Date Published: 26 August 1998
PDF: 8 pages
Proc. SPIE 3377, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX, (26 August 1998); doi: 10.1117/12.319365
Show Author Affiliations
Yasujiro Kiyota, Nikon Corp. (Japan)


Published in SPIE Proceedings Vol. 3377:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX
Gerald C. Holst, Editor(s)

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