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Proceedings Paper

Measurement and analysis of the optical parameters of two types of dye films
Author(s): Jinyan Li; Fuxi Gan; Donghong Gu; Xiaodong Tang
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Paper Abstract

The optical parameters of two type vacuum stabilized vanadium oxide phthalocyanine (VOPc) thin film samples were measured by a spectroscopic ellipsometer system. The results were obtained over the spectral from 270 nm to 1700 nm, and the thickness of each VOPc film was determined.

Paper Details

Date Published: 10 August 1998
PDF: 3 pages
Proc. SPIE 3562, Optical Storage Technology, (10 August 1998); doi: 10.1117/12.318498
Show Author Affiliations
Jinyan Li, Shanghai Institute of Optics and Fine Mechanics (China)
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics (China)
Donghong Gu, Shanghai Institute of Optics and Fine Mechanics (China)
Xiaodong Tang, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 3562:
Optical Storage Technology
Duanyi Xu; Seiya Ogawa, Editor(s)

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