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Proceedings Paper

Measurement and accuracy analysis of refractive index using a specular reflectivity close to the total internal reflection
Author(s): Hui Li; Zukang Lu; Shusen Xie; Lei Lin
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Paper Abstract

A new method to measure refractive index and the accuracy analysis as well is presented. The characteristic includes that the direction of incident light is not perpendicular to the interface but close to the critical angle of total internal reflection. That the specular reflectivity changes sharply near the critical angle implies that a high measuring sensitivity be reached easily. A narrow p- polarized laser beam and a prism or a quasi-semi-cylindrical lens in contact with a sample are applied in the apparatus. In order to match a high accuracy, a photoelectronic receiver with dual-channel divider is designed to compensate the stability of output of laser. One of the advantages of the method is its high accuracy. The uncertainty in the refractive index measurement is in the fourth decimal place at least. The exact direction of incident laser beam depends on the accuracy of result expected. Another outstanding advantage is its particularly straightforward in use experimental techniques. The method will be the most promising tool to study the response of refractive index to subtle changes of different conditions.

Paper Details

Date Published: 10 August 1998
PDF: 7 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318445
Show Author Affiliations
Hui Li, Zhejiang Univ. (China)
Zukang Lu, Zhejiang Univ. (China)
Shusen Xie, Fujian Teachers Univ. (China)
Lei Lin, Fujian Teachers Univ. (United States)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

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