Share Email Print
cover

Proceedings Paper

Optoelectronic technology for detecting flaws on internal surface of cylinder
Author(s): Ying Che; Yuzhi Shen; Hong Ma
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An optoelectronic instrument is introduced, in which the charge-coupled device camera and an optoelectronic probe are used to inspect the internal surface quality of cylinder with real-time and automatically. In this report, the working principle of the device is expounded, and the structure of the optoelectronic probe is explained.

Paper Details

Date Published: 10 August 1998
PDF: 4 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318438
Show Author Affiliations
Ying Che, Changchun Institute of Optics and Fine Mechanics (China)
Yuzhi Shen, Changchun Institute of Optics and Fine Mechanics (China)
Hong Ma, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

© SPIE. Terms of Use
Back to Top