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Proceedings Paper

Exploiting potentialities of linear CCD arrays in real-time dynamic measurement
Author(s): Changgui Li; Jinghai Liu; Youna Lin; Zhiyong Sun
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Paper Abstract

It is well known that linear CCD arrays have many advantages in static measurement, but many problems exist in dynamic measurement. For example, frequency bandwidth of an optical signal that can be tested is narrow and precision of sampled values is low in the case of continuous laser used as light source for a specific linear CCD array now available. So a method in which pulse laser is used is given to solve the problems. Not only precision of sampled values is improved, frequency bandwidth of an optical signal that can be tested is also extended. Potentialities of the specific linear CCD array now available is fully exploited. In this paper, how to make pulse laser and how to design electric circuits of a linear CCD array are discussed. The key step is how to synchronize them. Then, the sampling of placement signals using linear CCD array is compared with the sampling of voltage signals using A/D converters in concept. This would give us more clear image on comprehending the important role of pulse laser. At last, dynamic range of linear CCD arrays and some problems needing solving are discussed.

Paper Details

Date Published: 10 August 1998
PDF: 6 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318408
Show Author Affiliations
Changgui Li, China Institute of Metrology (China)
Jinghai Liu, Beijing Institute of Technology (China)
Youna Lin, Beijing Institute of Technology (China)
Zhiyong Sun, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

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