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Proceedings Paper

Optoelectronic noncontact inspection method of taper
Author(s): Guoyu Zhang; Zhiyong An; Huilin Jiang; Chengzhi Li; Yujin Gao; Rowei Chen
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Paper Abstract

Through the measurement of radial and axial dimension for cone, the non-contact measurement of taper is realized by using an optoelectronic inspecting system, which is composed of a laser-scanned measuring system, a grating displacement measuring system and a servo control system. Under microcomputer control, the three system make data exchange and control information conveying each other by communicating interface, and synchro control executive mechanism, they can realize the measurement of taper. The two diameters of the cone were measured by the laser-scanned measuring system, the axial dimension of the cone was measured by the grating displacement measuring system, through the computer real-time data processing, the taper of the measured cone was given out. The measured result was displayed or printed output. The measuring method has many features such as high speed, high accuracy and non-contact automatic measurement etc. It has great applicable prospects. In this paper, the measuring method of taper, the overall constitution of the optoelectronic inspecting system and the working principle were discussed in detail, the accuracy of the optoelectronic inspecting system was analyzed, and the practicability of the measuring method was verified by experiments.

Paper Details

Date Published: 10 August 1998
PDF: 5 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318392
Show Author Affiliations
Guoyu Zhang, Changchun Institute of Optics (China)
Zhiyong An, Changchun Institute of Optics and Fine Mechanics (China)
Huilin Jiang, Changchun Institute of Optics and Fine Mechanics (China)
Chengzhi Li, Changchun Institute of Optics and Fine Mechanics (China)
Yujin Gao, Changchun Institute of Optics and Fine Mechanics (China)
Rowei Chen, Changchun Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

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