Share Email Print
cover

Proceedings Paper

Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel
Author(s): Ying Che; Yuzhi Shen; Jiong Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An optoelectronic detecting instrument is introduced, in which the charge-coupled device is used to detect the roundness of internal aperture in artillery barrel. In this paper, we expound the working principle and the design idea, and analyze the measuring error of it.

Paper Details

Date Published: 10 August 1998
PDF: 5 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318381
Show Author Affiliations
Ying Che, Changchun Institute of Optics and Fine Mechanics (China)
Yuzhi Shen, Changchun Institute of Optics and Fine Mechanics (China)
Jiong Liu, Changchun Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

© SPIE. Terms of Use
Back to Top