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Proceedings Paper

Measurement technology of ultrafast optoelectronics
Author(s): Jilong Wang; Yuncai Wang; Shijie Chen
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Paper Abstract

This paper reviews recent progress in ultrafast optoelectronic measurement techniques utilizing ultrafast optical pulses, with particular emphasis on the wide range of novel applications of ultrafast optoelectronics for generation and measurement of ultrafast electrical signal. Such specific high-speed optoelectronic measurement techniques as photoconductive sampling, electro-optic sampling, picosecond photoemissive sampling etc. are described.

Paper Details

Date Published: 10 August 1998
PDF: 4 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318371
Show Author Affiliations
Jilong Wang, Taiyuan Univ. of Technology (China)
Yuncai Wang, Taiyuan Univ. of Technology (China)
Shijie Chen, Taiyuan Univ. of Technology (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

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