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Proceedings Paper

Online inspection system for steel-plate thickness
Author(s): Guoyu Zhang; Jiawu Song; Zhiyong An; Chengzhi Li; Yujin Gao; Rowei Chen
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Paper Abstract

Based on the laser inspecting technology and optical triangulation measuring principle, an on-line inspecting system for steel plate thickness was presented, which is an optoelectronic inspecting equipment used non-contact on-line automatic measurmg thickness of rolling steel plate in steel industry. The system used two semiconductor laser probes to realize the measurement of steel plate thickness. The measured result of steel plate thickness is directly given out. According to the request of on-line inspection, the system can make real-time processing for the measured data, and provide analog or digital feedback control signal to realize the closed loop control for rolling machine. In addition, the system has also many functions such as correcting system errors, acoustic and light alarming for exceeding the tolerance .limits, displaying and printing measured results etc. In this paper, the overall structure, working principle and optoelectronic information as well as data processing electronic system of the system were described. The theoretical problems related to the design of the system were discussed in detail.

Paper Details

Date Published: 10 August 1998
PDF: 7 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318370
Show Author Affiliations
Guoyu Zhang, Changchun Institute of Optics (China)
Jiawu Song, Changchun Institute of Optics and Fine Mechanics (China)
Zhiyong An, Changchun Institute of Optics and Fine Mechanics (China)
Chengzhi Li, Changchun Institute of Optics and Fine Mechanics (China)
Yujin Gao, Changchun Institute of Optics and Fine Mechanics (China)
Rowei Chen, Changchun Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

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