Share Email Print
cover

Proceedings Paper

Visual measurement on BGA chip leaders
Author(s): Shenghua Ye; Yu Qiu; Changku Sun
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Sometimes the objects of isolated surfaces, such as BGA chip leaders, need to be dealt with. Here, a method of visual measurement is proposed for on-line measurement. An image split-splicing technology is developed next to the theory of the system is analyzed to develop the test speed while keeping the resolution. Based on the theory, an isolated surface measurement system is formed for gauging the BGA leaders' top coplanarity.

Paper Details

Date Published: 10 August 1998
PDF: 4 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318365
Show Author Affiliations
Shenghua Ye, Tianjin Univ. (China)
Yu Qiu, Tianjin Univ. (China)
Changku Sun, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

© SPIE. Terms of Use
Back to Top