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Proceedings Paper

Effective approach for detecting bands of EBSP with Hough transform
Author(s): Linsen Chen; David P. Casasent
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Paper Abstract

An effective approach for the detection of the electron backscatter diffraction patterns with the Hough transform has been described in this paper. Based on the peak-finding method and the enhancement filter in the Hough space, this approach can give automatically the orientations, widths and coordinates of the central intersection points of the bands in the patterns. Comparison with other Hough approaches shows that our approach is more robust for the very low quality patterns and has an advantage of low time cost. No further fitting scheme or constrain conditions are needed to get correct bands. Results have been presented.

Paper Details

Date Published: 10 August 1998
PDF: 10 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318344
Show Author Affiliations
Linsen Chen, Suzhou Univ. (China)
David P. Casasent, Carnegie Mellon Univ. (United States)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

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