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Proceedings Paper

Apparatus for highly accurate measurement of transmittance and reflectance of large-sized optical components
Author(s): Yongming Hu; Zhe Chen; Yanbiao Liao; Shengli Chang; Zhou Meng; Zhe Han
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Paper Abstract

In the paper, an apparatus for high accurate measurements of transmittance and reflectance of large size optical components will be described. The working wavelengths of apparatus are 1.06 micrometers and 0.53micrometers respectively. It can measure both transmittance and reflectance of optical components simultaneously. And both plane and spherical optical component can be easily tested. The apparatus' measurement precision is less than 0.1 percent. The maximum measured size of components is 450 mm in diameter. The heaviest weight of measured component is about 20 kilograms. In this paper, the method of data processing and the schematic diagram will be presented.

Paper Details

Date Published: 10 August 1998
PDF: 7 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318340
Show Author Affiliations
Yongming Hu, Tsinghua Univ. (China)
Zhe Chen, Tsinghua Univ. (China)
Yanbiao Liao, Tsinghua Univ. (China)
Shengli Chang, Nanjing Univ. of Defense Technology (China)
Zhou Meng, Nanjing Univ. of Defense Technology (China)
Zhe Han, Nanjing Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

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