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Proceedings Paper

New 3D profilometry based on modulation measurement
Author(s): Xianyu Su; Likun Su; Wansong Li; Liqun Xiang
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Paper Abstract

This article propose a new optical method for 3-D profilometry, it is not based on the conventional method of structured light triangulation, but on modulation measurement(we briefly call it MMP). Its main advantage is that it can measure the surface of a testing object in the same direction of projecting light, so it has no the difficulties due to shadow and spatial discontinuity that exist in PMP and FTP methods and needn't to know the phases. We have measured some objects to verify this method and got some meaningful results. The results proved that this method can be useful to 3-D profilometry .. 3-D sensing machine vision and so on.

Paper Details

Date Published: 10 August 1998
PDF: 7 pages
Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318337
Show Author Affiliations
Xianyu Su, Sichuan Union Univ. (China)
Likun Su, Sichuan Union Univ. (China)
Wansong Li, Sichuan Union Univ. (China)
Liqun Xiang, Sichuan Union Univ. (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

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