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Proceedings Paper

Scanning multiple vernier etalons
Author(s): Hongbin Chen; Junyi Gao; Zhiben Gong
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Paper Abstract

Two identical mirrors of finite intensity reflectivity R that are separated by a distance L construct a conventional etalon. If one mirror is mounted on a piezoelectric element to permit scanning of the length of the etalon, it can be used to determine the wavelength of laser with the help of a well-known spectral line in limited range (one or several free spectral ranges of the etalon). Here we invent a kind of compact scanning multiple vernier etalon (MVET), which can measure laser wavelength and analyze laser spectral lines in wide wavelength range limited only by the response of the detectors and optics. Scanning MVET are constructed by several parallel pairs of etalons of slightly different thickness. All etalons have one common end mirror driven by a tubular piezoelectric element to permit scanning synchronously. If a laser beam is split into scanning MVET, transmission data from several etalons is gathered and several interference patterns are obtained. Analyzing these patterns, the laser wavelength can be determined with the calibrated free spectral ranges. We have developed a novel compact wavemeter for continuous wave laser by using this technique.

Paper Details

Date Published: 5 August 1998
PDF: 5 pages
Proc. SPIE 3557, Current Developments in Optical Elements and Manufacturing, (5 August 1998); doi: 10.1117/12.318319
Show Author Affiliations
Hongbin Chen, Anhui Institute of Optics and Fine Mechanics (China)
Junyi Gao, Anhui Institute of Optics and Fine Mechanics (China)
Zhiben Gong, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 3557:
Current Developments in Optical Elements and Manufacturing
Qiming Xin; Robert E. Parks, Editor(s)

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