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Proceedings Paper

Optical and structural characteristics of InGaAs/GaAs strained-layer superlattice
Author(s): Mei Li; Xueqian Li; Xiaowei Song; Zhongjiu Ge; Xingde Zhang
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Paper Abstract

In the present work, the structure characteristics on InGaAs-GaAs/GaAs strained-layer superlattice (SLS) samples have been studied by measuring x-ray double crystal rocking curve in the non-paralle (+.-) setting and photoluminescence (PL), respectively. Using x-ray kinematical theory, we have calculated structure parameters of SLS and discussed the influence of different substrates. Computer simulation of experimental curve have been performed with kinematical diffraction theory. The experimental and simulated curves are basically identical. Reliability of calculated results using x-ray double rocking curve is further confined by PL.

Paper Details

Date Published: 5 August 1998
PDF: 3 pages
Proc. SPIE 3557, Current Developments in Optical Elements and Manufacturing, (5 August 1998); doi: 10.1117/12.318274
Show Author Affiliations
Mei Li, Changchun Institute of Optics and Fine Mechanics (China)
Xueqian Li, Changchun Institute of Optics and Fine Mechanics (China)
Xiaowei Song, Changchun Institute of Optics and Fine Mechanics (China)
Zhongjiu Ge, Changchun Institute of Optics and Fine Mechanics (China)
Xingde Zhang, Changchun Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 3557:
Current Developments in Optical Elements and Manufacturing
Qiming Xin; Robert E. Parks, Editor(s)

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