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Proceedings Paper

Effects of different surface treatments of CZT samples on the values of DCRC FWHM of x-ray diffraction
Author(s): Yu Long Mo; Hui Huang; Juan Qin; Hua Chen; Gang Wu; Chaowang Liu; Dexiu Li
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Paper Abstract

Cd1-yZnyTe (CZT) wafers with (111) orientations, which serve as the common substrates for Hg1-xCdxTe (MCT) epitaxial deposition, were treated with different processes of mechanical polishing and chemical etching and then tested by x-ray diffraction unit with the same experimental conditions. The conclusion is that the sample surface treatment dramatically influences the values of DCRC FWHM. The most desirable process and its experimental conditions for accurate measurement of DCRC FWHM have also been reported in this paper.

Paper Details

Date Published: 11 August 1998
PDF: 5 pages
Proc. SPIE 3553, Detectors, Focal Plane Arrays, and Imaging Devices II, (11 August 1998); doi: 10.1117/12.318102
Show Author Affiliations
Yu Long Mo, Kunming Institute of Physics (China)
Hui Huang, Kunming Institute of Physics (China)
Juan Qin, Kunming Institute of Physics (China)
Hua Chen, Kunming Institute of Physics (China)
Gang Wu, Kunming Institute of Physics (China)
Chaowang Liu, Kunming Institute of Physics (China)
Dexiu Li, Yunnan Univ. (China)


Published in SPIE Proceedings Vol. 3553:
Detectors, Focal Plane Arrays, and Imaging Devices II
Pingzhi Liang; Marc Wigdor; William G. D. Frederick, Editor(s)

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