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Proceedings Paper

New method of measuring CCD device photoresponse nonuniformity
Author(s): Fu Wang; XueJu Shen; Weigang Chen; Xinhua Sun; Wei Dong; Bing Zhou
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Paper Abstract

A new method of measuring the PRN of CCD device is presented the PRN of CCD device can be determined quickly and accurately by this method, the effect of illuminance distribution nonuniformity on the measurement of CCD device PRN is eliminated.

Paper Details

Date Published: 11 August 1998
PDF: 2 pages
Proc. SPIE 3553, Detectors, Focal Plane Arrays, and Imaging Devices II, (11 August 1998); doi: 10.1117/12.318088
Show Author Affiliations
Fu Wang, Ordnance Engineering College (China)
XueJu Shen, Ordnance Engineering College (China)
Weigang Chen, Ordnance Engineering College (China)
Xinhua Sun, Ordnance Engineering College (China)
Wei Dong, Ordnance Engineering College (China)
Bing Zhou, Ordnance Engineering College (China)


Published in SPIE Proceedings Vol. 3553:
Detectors, Focal Plane Arrays, and Imaging Devices II
Pingzhi Liang; Marc Wigdor; William G. D. Frederick, Editor(s)

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