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Proceedings Paper

Function testing and failure analysis of integrated circuit chip using laser probe
Author(s): Xiaojian Tian; Maobin Yi; Daming Zhang; Wei Sun; Yanjun Gao
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Paper Abstract

Introduced the construction of the experiment system of the laser probe measurements based on electro-optic sampling technique. Analyzed the relationship between the width of the optical pulses and the signal noise ratio of detection. The function of different stage circuit internal to the high-speed dynamic divider circuit chip have been measured with the double-frequency phase sweeping technique. A detail analysis about the chip failure have been given.

Paper Details

Date Published: 12 August 1998
PDF: 4 pages
Proc. SPIE 3551, Integrated Optoelectronics II, (12 August 1998); doi: 10.1117/12.317981
Show Author Affiliations
Xiaojian Tian, Jilin Univ. (China)
Maobin Yi, Jilin Univ. (China)
Daming Zhang, Jilin Univ. (China)
Wei Sun, Jilin Univ. (China)
Yanjun Gao, Jilin Univ. (China)


Published in SPIE Proceedings Vol. 3551:
Integrated Optoelectronics II
BingKun Zhou; Ray T. Chen, Editor(s)

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