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Proceedings Paper

Remote sensing of lightning return stroke current parameters: feasibility and uncertainty
Author(s): Boayou Zhu; Shanchang Tao
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Paper Abstract

Recently, lightning location system with LF/VLF bandwidth has been widely used in the world, therefore it is interesting to investigate the feasibility and uncertainty of deriving lightning return stoke current parameters from remote electromagnetic fields measured by lightning location system. Calculations are presented to check the validity of the electric field expression which was given by Uman [1970] on hypothesis of Transmission Line Model (TLM), and the results show that TLM somewhat underestimates the peak of the currents and the risetime of current deduced from the model may be unconvincing. A modified expression dealing with the peak of electric field vs. the current is developed by using modified transmission line model as well as taking into account propagation attenuation and effect of slant lightning certainty of the derived current peak depends on the truth of the assumed return stroke (RS) velocity and the precision of measured electric field and distance. Due to propagation effect the risetime of the electric field is different from that of the current and the increase of the rise of the electric field against that of the current varies with propagation conditions and the current waveform. The risetime of current waveform can be roughly estimated form that of the electric field waveform, but there exists considerable uncertainty due to uncertainty of assumed ground conductivity.

Paper Details

Date Published: 18 August 1998
PDF: 8 pages
Proc. SPIE 3501, Optical Remote Sensing of the Atmosphere and Clouds, (18 August 1998); doi: 10.1117/12.317731
Show Author Affiliations
Boayou Zhu, Univ. of Science and Technology of China (China)
Shanchang Tao, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 3501:
Optical Remote Sensing of the Atmosphere and Clouds
Jinxue Wang; Beiying Wu; Toshihiro Ogawa; Zheng-hua Guan, Editor(s)

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