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Proceedings Paper

Test system design used to characterize and test the MOSAD technology multiplexed oversampled A/D all-digital FPA
Author(s): Jan M. Braathen
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Paper Abstract

The MOSAD, Multiplexed Oversampled Analog to Digital conversion approach at Amain Electronics research center, introduces an extremely low power on focal plane analog to digital conversion at each pixel site. The MOSAD technology has been tested and characterized for different focal plane array sizes. This approach has demonstrated superior linearity, well capacity and signal to noise ratio, which exceeds existing A/D capabilities, by eliminating all analog multiplexing and readout electronics off focal plane. This document describes the design, characterization and testing methodology to satisfy the variety of requirements for the readout interface to the MOSAD technology. The necessary readout interface electronics used to validate the MOSAD technology with Dewar assembly is presented. Results from the testing performance considerations such as signal to noise ratio are discussed. Amain Electronics test methodology considerations are described to show that an all digital focal plane array simplifies the future FPA test complexity and methodology.

Paper Details

Date Published: 22 July 1998
PDF: 9 pages
Proc. SPIE 3379, Infrared Detectors and Focal Plane Arrays V, (22 July 1998); doi: 10.1117/12.317617
Show Author Affiliations
Jan M. Braathen, Amain Electronics Co. (United States)

Published in SPIE Proceedings Vol. 3379:
Infrared Detectors and Focal Plane Arrays V
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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