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Proceedings Paper

Retroreflector diffraction modeling
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Paper Abstract

The SIM metrology subsystem utilizes cornercube retroreflectors as fiducials. These components will introduce errors in the metrology output that must be quantified. Eventually, a complete modeling of the metrology subsystem will be needed. For that purpose, we are developing an optical model for a cornercube retroreflector, taking into account most of the defects present in such an optical part. Our goal is to given a phase map of the wavefront produced by the interference of the reference beam and the metrology beam. Our first step towards this goal is the construction of an optical model and its validation, using the MACOS and VSIM packages.

Paper Details

Date Published: 24 July 1998
PDF: 7 pages
Proc. SPIE 3350, Astronomical Interferometry, (24 July 1998); doi: 10.1117/12.317186
Show Author Affiliations
Sacha Loiseau, Jet Propulsion Lab. (France)
Stuart B. Shaklan, Jet Propulsion Lab. (United States)
David C. Redding, Jet Propulsion Lab. (United States)
Edouard G. Schmidtlin, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 3350:
Astronomical Interferometry
Robert D. Reasenberg, Editor(s)

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