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Proceedings Paper

Metrology source for high-resolution heterodyne interferometer laser gauges
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Paper Abstract

We describe the development, functional performance, and space-qualification status of a Metrology Source suitable for implementation of space-based metrology systems with picometer-level relative displacement measurement and micron-level absolute displacement measurement resolution. The Metrology Source consists of the following components: lasers, frequency stabilization system, frequency shifters, and frequency modulators. All components are interconnected by polarization maintaining fibers to facilitate integration into a lightweight space-qualifiable module.

Paper Details

Date Published: 24 July 1998
PDF: 12 pages
Proc. SPIE 3350, Astronomical Interferometry, (24 July 1998); doi: 10.1117/12.317166
Show Author Affiliations
Serge Dubovitsky, Jet Propulsion Lab. (United States)
David J. Seidel, Jet Propulsion Lab. (United States)
Duncan Tsuen-Hsi Liu, Jet Propulsion Lab. (United States)
Roman C. Gutierrez, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 3350:
Astronomical Interferometry
Robert D. Reasenberg, Editor(s)

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