Share Email Print
cover

Proceedings Paper

Physical-model-based restoration of mammographies
Author(s): Jean-Marc Dinten; Jean-Marc Volle
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Two main phenomena degrade the quality of a mammogram: the blur induced by X-rays scattering and a loss of contrast due to beam hardening. In this paper, we propose an original approach to restore the mammographies from these degradations. They are due to the physical phenomena occurring in the radiographic image formation process. Our objective has been to construct a physical model describing accurately the phenomena while being tractable to enable an inversion and therefore to construct a corrected mammography. In fact, we show that, in reason of the specific protocol for realizing a mammographic exam, and the composition of the breast in mainly two components (fat and glandular tissue), the observed values can be related to the thickness of glandular tissue crossed by the X-rays. This relation is nonlinear, and expresses the different phenomena taking place in the acquisition process. An adapted inversion scheme enables to build up a map of the thicknesses of glandular tissue. This representation enhances significantly the mammograms. As the approach only relies, on one hand on priors deduced from the acquisition geometry and from the breast composition, and on the other hand on a physical description of the acquisition process, it does not create artifacts that may alter the physician's diagnosis.

Paper Details

Date Published: 24 July 1998
PDF: 10 pages
Proc. SPIE 3336, Medical Imaging 1998: Physics of Medical Imaging, (24 July 1998); doi: 10.1117/12.317068
Show Author Affiliations
Jean-Marc Dinten, LETI-CEA (France)
Jean-Marc Volle, LETI-CEA (France)


Published in SPIE Proceedings Vol. 3336:
Medical Imaging 1998: Physics of Medical Imaging
James T. Dobbins; John M. Boone, Editor(s)

© SPIE. Terms of Use
Back to Top