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Proceedings Paper

New CsI/a-Si 17" x 17" x-ray flat-panel detector provides superior detectivity and immediate direct digital output for general radiography systems
Author(s): Christophe Chaussat; Jean Chabbal; Thierry Ducourant; Vincent Spinnler; Gerard Vieux; Robert Neyret
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Paper Abstract

A new 17' X 17' immediate direct digital flat panel detector has been developed to fit the needs of General Radiography. After reviewing a few key aspects of the General Radiography needs (X-ray energy range and associated measurement conditions, system integration and system operation), we describe the new detector Cesium Iodide/Amorphous Silicon based technology, and give measurement results (MTF, DQE stability). We compare the new detector performance to existing technologies (film/screen combination, storage phosphor devices) and also to other flat panel solutions (Selenium). We conclude that the CsI/a-Si technology is now the best suited one in order to fit the needs of General Radiography, this means all kinds of examinations (chest, abdomen, bones, extremities. . .) which have been up to now done using films.

Paper Details

Date Published: 24 July 1998
PDF: 12 pages
Proc. SPIE 3336, Medical Imaging 1998: Physics of Medical Imaging, (24 July 1998); doi: 10.1117/12.317049
Show Author Affiliations
Christophe Chaussat, Trixell (France)
Jean Chabbal, Trixell (France)
Thierry Ducourant, Trixell (France)
Vincent Spinnler, Trixell (France)
Gerard Vieux, Trixell (France)
Robert Neyret, Trixell (France)

Published in SPIE Proceedings Vol. 3336:
Medical Imaging 1998: Physics of Medical Imaging
James T. Dobbins; John M. Boone, Editor(s)

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