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Proceedings Paper

New digital processing algorithm for determining the direction and magnitude of the strain from quadrature phase-shifted fiber optic signals
Author(s): Il-Bum Kwon; M. S. Bae; Man-Yong Choi; Hahngue Moon
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Paper Abstract

A digital signal processing algorithm, Kwon's method, was developed for strain measurement by a passive quadrature demodulated fiber optic Michelson interferometric sensor. The fiber optic Michelson sensor, which is constructed of a 3 by 3 fiber optic coupler, can give the information about the magnitude and direction of the strain of structures. The beating, drifting, and noise, which are caused by the longitudinal strain and the lateral strain of the fiber, bring about the counting error of the phase differences. Kwon's algorithm is based on the reference line crossing count method and resets the reference line during the presence of the signal drifting. The accuracy of the strain calculation was confirmed by the various simulated fiber optic signals with signal beating, drifting and noise. A passive quadrature demodulated 3 by 3 fiber optic Michelson interferometric sensor was bonded on the cantilevered aluminum beam to experiment the strain sensing. The capability of the real-time processing was verified by the real fiber optic signals.

Paper Details

Date Published: 21 July 1998
PDF: 12 pages
Proc. SPIE 3330, Smart Structures and Materials 1998: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials, (21 July 1998); doi: 10.1117/12.316993
Show Author Affiliations
Il-Bum Kwon, Korea Research Institute of Standards and Science (South Korea)
M. S. Bae, Korea Research Institute of Standards and Science (South Korea)
Man-Yong Choi, Korea Research Institute of Standards and Science (South Korea)
Hahngue Moon, Korea Research Institute of Standards and Science (South Korea)


Published in SPIE Proceedings Vol. 3330:
Smart Structures and Materials 1998: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials
Richard O. Claus; William B. Spillman, Editor(s)

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