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Proceedings Paper

Ionically self-assembled second-order nonlinear optical thin film materials and devices
Author(s): Yanjing Liu; Youxiong Wang; Wei Zhao; Richard O. Claus; Kevin Lenehan; James Randy Heflin
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Paper Abstract

We report that anew ionically self-assembled monolayer (ISAM) method for thin-film deposition can be employed to fabricate materials possessing the noncentrosymmetry that is required for a second order, (Chi) (2), nonlinear optical response. Using several different commercially- available polyelectrolytes and additional precursors designed and fabricated in our laboratories, we have produced ISAM nonlinear optical thin films with (Chi) (2) films self-assemble into a noncentrosymmetric structure that has exhibited no measurable decay of (Chi) (2) at room temperature over a period of more than four months. The (Chi) (2) of ISAM thin-films has been examined by second harmonic generation using a fundamental wavelength of 1200 nm. The second harmonic intensity of the films exhibits the expected quadratic consistent with orientation of the chromophobe dipole moment perpendicular to the substrate. We describe the potential application of such NLO thin-film materials in field sensing elements and support instrumentation systems.

Paper Details

Date Published: 21 July 1998
PDF: 5 pages
Proc. SPIE 3330, Smart Structures and Materials 1998: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials, (21 July 1998); doi: 10.1117/12.316960
Show Author Affiliations
Yanjing Liu, Virginia Polytechnic Institute and State Univ. (United States)
Youxiong Wang, Virginia Polytechnic Institute and State Univ. (United States)
Wei Zhao, Virginia Polytechnic Institute and State Univ. (United States)
Richard O. Claus, Virginia Polytechnic Institute and State Univ. (United States)
Kevin Lenehan, Virginia Polytechnic Institute and State Univ. (United States)
James Randy Heflin, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 3330:
Smart Structures and Materials 1998: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials
Richard O. Claus; William B. Spillman, Editor(s)

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