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Proceedings Paper

Detection and measurement of ice thickness using microprocessor-controlled resonant transducers
Author(s): Shuvo Roy; Alain Izad; Russell G. DeAnna; Mehran Mehregany
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Paper Abstract

An ice detection system consisting of a resonant piezoelectric sensing-element and microprocessor control has been developed to automatically and distinctly sense ice and water films up to 0.5 mm thick. Accretion of ice and/or water on the sensor surface modifies the effective mass and/or stiffness of the vibrating transducer; these variations are sensed by measuring the changes in transducer resonant frequency. In case of ice films, resonant frequency of the transducer increases steadily from 14 kHz for a 0.06 mm-thick layer to 28 kHz when the ice film is 0.45 mm thick. In contrast, the transducer resonant frequency decreases slightly from 10 kHz for a 0.06 mm-thick layer of water to 9.5 kHz for a 0.45 mm-thick film. Repeatability experiments revealed test-to-test variations of 3.8% and 0.7% for ice and water films, respectively. A portable, low-power, microprocessor-controlled electronic circuit has been designed and implemented to automate the resonant frequency measurement and determine the thickness of ice/water present on the transducer surface.

Paper Details

Date Published: 27 July 1998
PDF: 11 pages
Proc. SPIE 3329, Smart Structures and Materials 1998: Smart Structures and Integrated Systems, (27 July 1998); doi: 10.1117/12.316899
Show Author Affiliations
Shuvo Roy, Case Western Reserve Univ. (United States)
Alain Izad, Case Western Reserve Univ. (United States)
Russell G. DeAnna, Case Western Reserve Univ. (United States)
Mehran Mehregany, Case Western Reserve Univ. (United States)


Published in SPIE Proceedings Vol. 3329:
Smart Structures and Materials 1998: Smart Structures and Integrated Systems
Mark E. Regelbrugge, Editor(s)

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