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Proceedings Paper

Effects of native oxides and optical confinement on microactivity VCSEL spontaneous emission
Author(s): John P. Loehr; Michael J. Noble; James A. Lott
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Paper Abstract

Threshold currents in small-aperture VCSELs are likely to be dominated by diffraction losses. We have developed a semianalytic technique to estimate the lasing mode energies, field profiles and cavity losses--including absorption, mirror, and diffraction losses--in oxide-apertured VCSELs. By coupling these modes to the full, nonparabolic electronic bandstructure, and by solving the resulting multimode related rate equations, we can model the light versus current characteristics of microcavity VCSELs. We apply our model to a low-threshold VCSEL structure and calculate threshold currents of 30 - 40 (mu) A, in qualitative agreement with experiments. We estimate spontaneous emission factors (beta) as large as 1.7 X 10-2 for a 1.5 micrometers radius device.

Paper Details

Date Published: 7 July 1998
PDF: 11 pages
Proc. SPIE 3283, Physics and Simulation of Optoelectronic Devices VI, (7 July 1998); doi: 10.1117/12.316736
Show Author Affiliations
John P. Loehr, Air Force Research Lab. (United States)
Michael J. Noble, Air Force Institute of Technology (United States)
James A. Lott, Air Force Institute of Technology (United States)


Published in SPIE Proceedings Vol. 3283:
Physics and Simulation of Optoelectronic Devices VI
Marek Osinski; Peter Blood; Akira Ishibashi, Editor(s)

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