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Proceedings Paper

Thermo-optic properties of aluminum nitride waveguides
Author(s): Xiao Tang; Yifang Yuan; Kobchat Wongchotigul; Michael G. Spencer; Han Ying; Zhang Ling
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Paper Abstract

Aluminum nitride (AlN) thin film is a wide bandgap semiconductor which shows great potential for opto- electronic applications in blue and ultraviolet regions. A prism-thin film coupling technique, and an automatic temperature controlling device have been used to study the thermo-optic properties of single crystalline aluminum nitride thin films grown on sapphire substrates by low pressure metal organic chemical vapor deposition. The temperature coefficient of refractive index ne for AlN is determined to be 6 X 10-5/ degree(s)C at a wavelength of 632.8 nm.

Paper Details

Date Published: 7 July 1998
PDF: 4 pages
Proc. SPIE 3283, Physics and Simulation of Optoelectronic Devices VI, (7 July 1998); doi: 10.1117/12.316647
Show Author Affiliations
Xiao Tang, Howard Univ. (United States)
Yifang Yuan, Univ. of Shanghai for Science and Technology (China)
Kobchat Wongchotigul, Howard Univ. (United States)
Michael G. Spencer, Howard Univ. (United States)
Han Ying, Univ. of Shanghai for Science and Technology (China)
Zhang Ling, Univ. of Shanghai for Science and Technology (China)


Published in SPIE Proceedings Vol. 3283:
Physics and Simulation of Optoelectronic Devices VI
Marek Osinski; Peter Blood; Akira Ishibashi, Editor(s)

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