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Proceedings Paper

Detection of bands in backscatter microscopy images using new Hough transform techniques
Author(s): David P. Casasent; Linsen Chen; Ashit Talukder
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Paper Abstract

Electron backscatter patterns are used to analyze the crystallographic structure of materials and extract 3D grain orientation data that is of use in material science. We present new Hough transform pre- and post-processing algorithms to improve analysis of such data. Our new technique also reduces the computation time required.

Paper Details

Date Published: 8 July 1998
PDF: 12 pages
Proc. SPIE 3389, Hybrid Image and Signal Processing VI, (8 July 1998); doi: 10.1117/12.316530
Show Author Affiliations
David P. Casasent, Carnegie Mellon Univ. (United States)
Linsen Chen, Carnegie Mellon Univ. (United States)
Ashit Talukder, Carnegie Mellon Univ. (United States)

Published in SPIE Proceedings Vol. 3389:
Hybrid Image and Signal Processing VI
David P. Casasent; Andrew G. Tescher, Editor(s)

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