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Proceedings Paper

Extension of electronic speckle correlation interferometry to large deformations
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Paper Abstract

The process of fringe formation under simultaneous illumination in two orthogonal directions is analyzed. Procedures to extend the applicability of this technique to large deformation and high density of fringes are introduced. The proposed techniques are applied to a number of technical problems. Good agreement is obtained when the experimental results are compared with results obtained by other methods.

Paper Details

Date Published: 6 July 1998
PDF: 12 pages
Proc. SPIE 3479, Laser Interferometry IX: Applications, (6 July 1998); doi: 10.1117/12.316456
Show Author Affiliations
Cesar A. Sciammarella, Illinois Institute of Technology (United States)
Federico M. Sciammarella, Illinois Institute of Technology (United States)

Published in SPIE Proceedings Vol. 3479:
Laser Interferometry IX: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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