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Proceedings Paper

Characterization of an optical subsystem for 2-um coherent lidars
Author(s): Ye Li; Timothy Scott Blackwell; Joseph M. Geary; Farzin Amzajerdian; Gary D. Spiers; Bruce R. Peters; Diana Chambers
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Paper Abstract

This paper presents the test results on a compact, off-axis telescope which is the precursor projector/receiver for a NASA Shuttle-based coherent lidar system operating at a wavelength of 2 microns to measure atmospheric wind profiles. The afocal telescope has an entrance pupil diameter of 25 cm, and an angular magnification of 25x. To determine the transmitted and returned optical wavefront quality, the telescope was tested in a Twyman-Green configuration at the operational wavelength. Interferograms were obtained via an infrared camera, and analyzed using a digitizing tablet and WYKO WISP software. Interferograms were obtained with and without an 11.7 degree wedged silicon window located in the entrance pupil. This window, which rotates orthogonal to the telescope optical axis, serves as the lidar system scanner. The measured wavefront information from the interferometer was used in a GLAD heterodyne receiver model to predict the effect of the optical system on the lidar performance. The experimental setup and procedures will be described, and the measurement results of the coherent lidar optical subsystem will be presented in this paper.

Paper Details

Date Published: 6 July 1998
PDF: 8 pages
Proc. SPIE 3479, Laser Interferometry IX: Applications, (6 July 1998); doi: 10.1117/12.316441
Show Author Affiliations
Ye Li, Univ. of Alabama in Huntsville (United States)
Timothy Scott Blackwell, Univ. of Alabama in Huntsville (United States)
Joseph M. Geary, Univ. of Alabama in Huntsville (United States)
Farzin Amzajerdian, Univ. of Alabama in Huntsville (United States)
Gary D. Spiers, Univ. of Alabama in Huntsville (United States)
Bruce R. Peters, Univ. of Alabama in Huntsville (United States)
Diana Chambers, Micro Craft Inc. (United States)


Published in SPIE Proceedings Vol. 3479:
Laser Interferometry IX: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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