Share Email Print

Proceedings Paper

Refinements in practical accuracy factors for resistor-array IR scene projectors
Author(s): Alan P. Pritchard; Mark A. Venables; Stephen Paul Lake; David W. Gough
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We describe incremental improvements in measurement, understanding and control of sensor-perceived scene accuracy factors for BAe resistor-array IR scene projector devices by means of system and device design, analysis and measurement methodology. Progress has been made in the areas of fill- factor measurement, aliasing effects, dead pixel statistics, image spreading, the design of non-uniformity correction (NUC) systems, busbar robbing, heatsink effects and noise sources.

Paper Details

Date Published: 13 July 1998
PDF: 8 pages
Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); doi: 10.1117/12.316390
Show Author Affiliations
Alan P. Pritchard, British Aerospace Ltd. (United Kingdom)
Mark A. Venables, British Aerospace Ltd. (United Kingdom)
Stephen Paul Lake, British Aerospace Ltd. (United Kingdom)
David W. Gough, British Aerospace Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 3368:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
Robert Lee Murrer, Editor(s)

© SPIE. Terms of Use
Back to Top