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Proceedings Paper

Current status of the laser diode array projector technology
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Paper Abstract

This paper describes recent developments and the current status of the Laser Diode Array Projector (LDAP) Technology. The LDAP is a state-of-the-art dynamic infrared scene projector system capable of generating high resolution in-band infrared imagery at high frame rates. Three LDAPs are now operational at the U.S. Army Aviation and Missile Command's (AMCOM) Missile Research, Development, and Engineering Center (MRDEC). These projectors have been used to support multiple Hardware-in-the-Loop test entries of various seeker configurations. Seeker configurations tested include an InSb 256 X $256 focal-plane array (FPA), an InSb 512 X 512 FPA, a PtSi 640 X 480 FPA, a PtSi 256 X 256 FPA, an uncooled 320 X 240 microbolometer FPA, and two dual field- of-view (FOV) seekers. Several improvements in the projector technology have been made since we last reported in 1997. The format size has been increased to 544 X 544, and 672 X 512, and it has been proven that the LDAP can be synchronized without a signal from the unit-under test (UUT). The control software has been enhanced to provide 'point and click' control for setup, calibration, image display, image capture, and data analysis. In addition, the first long-wave infrared (LWIR) LDAP is now operational, as well as a dual field of view LDAP which can change its FOV within 0.25 seconds. The projector is interfaced to a Silicon Graphics scene generation computer which is capable of real-time 3-D scene generation. Sample images generated with the projector and captured by an InSb FPA sensor are included in the text.

Paper Details

Date Published: 13 July 1998
PDF: 9 pages
Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); doi: 10.1117/12.316389
Show Author Affiliations
D. Brett Beasley, Optical Sciences Corp. (United States)
Daniel A. Saylor, Optical Sciences Corp. (United States)


Published in SPIE Proceedings Vol. 3368:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
Robert Lee Murrer, Editor(s)

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