Share Email Print
cover

Proceedings Paper

Unique digital imagery interface between a silicon graphics computer and the kinetic kill vehicle hardware-in-the-loop simulator (KHILS) wideband infrared scene projector (WISP)
Author(s): Ricky A. Erickson; Stephen E. Moren; Marion S. Skalka
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Providing a flexible and reliable source of IR target imagery is absolutely essential for operation of an IR Scene Projector in a hardware-in-the-loop simulation environment. The Kinetic Kill Vehicle Hardware-in-the-Loop Simulator (KHILS) at Eglin AFB provides the capability, and requisite interfaces, to supply target IR imagery to its Wideband IR Scene Projector (WISP) from three separate sources at frame rates ranging from 30 - 120 Hz. Video can be input from a VCR source at the conventional 30 Hz frame rate. Pre-canned digital imagery and test patterns can be downloaded into stored memory from the host processor and played back as individual still frames or movie sequences up to a 120 Hz frame rate. Dynamic real-time imagery to the KHILS WISP projector system, at a 120 Hz frame rate, can be provided from a Silicon Graphics Onyx computer system normally used for generation of digital IR imagery through a custom CSA-built interface which is available for either the SGI/DVP or SGI/DD02 interface port. The primary focus of this paper is to describe our technical approach and experience in the development of this unique SGI computer and WISP projector interface.

Paper Details

Date Published: 13 July 1998
PDF: 10 pages
Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); doi: 10.1117/12.316383
Show Author Affiliations
Ricky A. Erickson, Computer Science and Applications, Inc. (United States)
Stephen E. Moren, Computer Science and Applications, Inc. (United States)
Marion S. Skalka, Computer Science and Applications, Inc. (United States)


Published in SPIE Proceedings Vol. 3368:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
Robert Lee Murrer, Editor(s)

© SPIE. Terms of Use
Back to Top