Share Email Print

Proceedings Paper

Requirements and methodologies for real-time infrared sensor emulation in hardware-in-the-loop testing
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Hardware-in-the-loop (HWIL) testing of infrared missile seekers has been a proven method for seeker evaluation for many years. Infrared HWIL testing has two primary modes, projection or injection. With infrared projection HWIL testing, the seeker's optics and detectors are retained as part of the simulation since an infrared scene in the correct waveband is presented to the seeker's optics, and is then detected and processed. When using the injection mode of HWIL testing the infrared scene is injected directly into the seeker's electronics and bypasses the imaging and detection process. When this type of simulation is used it is critical to model the optical and electrical processes that would have degraded the image in a real-world scenario. Real-time modeling of sensor system modulation transfer functions and other forms of image degradation is a computationally intensive task. The types of calculations necessary for real- time sensor modeling often push the processing requirements past the capabilities of standard processors and custom processing hardware is required. This paper discusses solutions to this problem that have been implemented for infrared seekers at the U.S. Army's Aviation and Missile Command's, Missile Research, Development, and Engineering Center.

Paper Details

Date Published: 13 July 1998
PDF: 6 pages
Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); doi: 10.1117/12.316381
Show Author Affiliations
James A. Buford, U.S. Army Aviation and Missile Command (United States)
Terry M. Reynolds, Simulation Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 3368:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
Robert Lee Murrer, Editor(s)

© SPIE. Terms of Use
Back to Top