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Proceedings Paper

Design and development of a flexible COTS-based nonuniformity data collection interface system
Author(s): Mark August Manzardo; Kenneth W. Zabel; Howard C. Graves III; Bruce E. Tucker; Eddie Burroughs Jr.; Kenneth G. LeSueur
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Paper Abstract

Many test facilities currently have the requirement to project dynamic, infrared (IR) imagery into sensors under test. This imagery must be of sufficient quality and resolution so that, sensors under test will perceive and respond just as they do to real-world scenes. In order to achieve this fidelity from an infrared micro-resistor based emitter array, Non-Uniformity Correction (NUC) is necessary. An important step in performing NUC is to calibrate the IR projection system so as to be capable of projecting a uniform temperature/IR image. The quality of the projected image is significantly enhanced by proper application of this calibration. To properly implement non-uniformity correction, it is necessary to accurately measure the IR emissions of each display element, or display pixel (dixel), in the emitter array. Performing these measurements involves collecting a large volume of data at a high rate. The U.S. Army's Test and Evaluation Command (TECOM) has developed a high-speed, relatively inexpensive and flexible means of digitally capturing IR emissions from an emitter array. This method of digitally capturing IR imagery is also useful in performing sensor and overall system characterization. TECOM has investigated, planned, and developed a non-uniformity data collection system, using primarily Commercial Off-The-Shelf (COTS) hardware and software, capable of digitally capturing the emissions of a long wave IR emitter array at 30 frames per second. The digital images are then processed to characterize individual dixels of the IR scene projection system. This paper presents a description of a test facility's need, along with a history of the design, development and actual implementation of a non- uniformity data collection system. In addition to the primary purpose of collecting digital imagery for NUC, other system uses for digital imagery collection are discussed.

Paper Details

Date Published: 13 July 1998
PDF: 10 pages
Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); doi: 10.1117/12.316380
Show Author Affiliations
Mark August Manzardo, SPARTA, Inc. (United States)
Kenneth W. Zabel, SPARTA, Inc. (United States)
Howard C. Graves III, SPARTA, Inc. (United States)
Bruce E. Tucker, SPARTA, Inc. (United States)
Eddie Burroughs Jr., Redstone Technical Test Ctr. (United States)
Kenneth G. LeSueur, Redstone Technical Test Ctr. (United States)


Published in SPIE Proceedings Vol. 3368:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
Robert Lee Murrer Jr., Editor(s)

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