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Proceedings Paper

Real-time synchronized multiple-sensor IR/EO scene generation utilizing the SGI Onyx2
Author(s): Robert J. Makar; Brian E. O'Toole
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Paper Abstract

An approach to utilize the symmetric multiprocessing environment of the Silicon Graphics Inc.R (SGI) Onyx2TM has been developed to support the generation of IR/EO scenes in real-time. This development, supported by the Naval Air Warfare Center Aircraft Division (NAWC/AD), focuses on high frame rate hardware-in-the-loop testing of multiple sensor avionics systems. In the past, real-time IR/EO scene generators have been developed as custom architectures that were often expensive and difficult to maintain. Previous COTS scene generation systems, designed and optimized for visual simulation, could not be adapted for accurate IR/EO sensor stimulation. The new Onyx2 connection mesh architecture made it possible to develop a more economical system while maintaining the fidelity needed to stimulate actual sensors. An SGI based Real-time IR/EO Scene Simulator (RISS) system was developed to utilize the Onyx2's fast multiprocessing hardware to perform real-time IR/EO scene radiance calculations. During real-time scene simulation, the multiprocessors are used to update polygon vertex locations and compute radiometrically accurate floating point radiance values. The output of this process can be utilized to drive a variety of scene rendering engines. Recent advancements in COTS graphics systems, such as the Silicon Graphics InfiniteRealityR make a total COTS solution possible for some classes of sensors. This paper will discuss the critical technologies that apply to infrared scene generation and hardware-in-the-loop testing using SGI compatible hardware. Specifically, the application of RISS high-fidelity real-time radiance algorithms on the SGI Onyx2's multiprocessing hardware will be discussed. Also, issues relating to external real-time control of multiple synchronized scene generation channels will be addressed.

Paper Details

Date Published: 13 July 1998
PDF: 10 pages
Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); doi: 10.1117/12.316374
Show Author Affiliations
Robert J. Makar, Amherst Systems, Inc. (United States)
Brian E. O'Toole, Amherst Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 3368:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
Robert Lee Murrer, Editor(s)

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