Share Email Print
cover

Proceedings Paper

Eglin virtual range database for hardware-in-the-loop testing
Author(s): Sunjay E. Talele; J. Warren Pickard; Monte A. Owens; Joseph Foster; John S. Watson; Mary Amenda Amick; Kenneth Anthony
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Realistic backgrounds are necessary to support high fidelity hardware-in-the-loop testing. Advanced avionics and weapon system sensors are driving the requirement for higher resolution imagery. The model-test-model philosophy being promoted by the T&E community is resulting in the need for backgrounds that are realistic or virtual representations of actual test areas. Combined, these requirements led to a major upgrade of the terrain database used for hardware-in-the-loop testing at the Guided Weapons Evaluation Facility (GWEF) at Eglin Air Force Base, Florida. This paper will describe the process used to generate the high-resolution (1-foot) database of ten sites totaling over 20 square kilometers of the Eglin range. this process involved generating digital elevation maps from stereo aerial imagery and classifying ground cover material using the spectral content. These databases were then optimized for real-time operation at 90 Hz.

Paper Details

Date Published: 13 July 1998
PDF: 19 pages
Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); doi: 10.1117/12.316371
Show Author Affiliations
Sunjay E. Talele, Nichols Research Corp. (United States)
J. Warren Pickard, ERC, Inc. (United States)
Monte A. Owens, Nichols Research Corp. (United States)
Joseph Foster, Nichols Research Corp. (United States)
John S. Watson, Nichols Research Corp. (United States)
Mary Amenda Amick, 46th Test Wing/Guided Weapons Evaluation Directorate (United States)
Kenneth Anthony, 46th Test Wing/Guided Weapons Evaluation Facility (United States)


Published in SPIE Proceedings Vol. 3368:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
Robert Lee Murrer, Editor(s)

© SPIE. Terms of Use
Back to Top