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Proceedings Paper

Versatile electronic speckle pattern interferometry
Author(s): Rajpal S. Sirohi
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Paper Abstract

The paper presents a configuration to record out-of-plane displacement component and slope simultaneously using electronic speckle pattern interferometry. The retrieval of information, however, is possible only by Fourier processing.

Paper Details

Date Published: 30 June 1998
PDF: 4 pages
Proc. SPIE 3478, Laser Interferometry IX: Techniques and Analysis, (30 June 1998); doi: 10.1117/12.312964
Show Author Affiliations
Rajpal S. Sirohi, National Univ. of Singapore (India)

Published in SPIE Proceedings Vol. 3478:
Laser Interferometry IX: Techniques and Analysis
Malgorzata Kujawinska; Gordon M. Brown; Mitsuo Takeda, Editor(s)

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