Share Email Print
cover

Proceedings Paper

Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis
Author(s): J. L. Fernandez; Antonio Fernandez; Angel F. Doval; Abundio Davila; Jesus Blanco-Garcia; Carlos Perez-Lopez
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We report on a novel technique for the evaluation of transient phase in double-pulsed electronic speckle-shearing pattern interferometry. Our technique requires the acquisition of just two speckle-shear interferograms which are correlated by subtraction to obtain a fringe pattern. A spatial carrier is generated by means of an original optical setup based on the separation and later recombination of the two beams produced by a Nd:YAG twin pulsed laser. One introduces an optical path difference in the curvature radii of the illumination beams by mismatching the distances from two diverging lenses to a beam combiner. This procedure gives rise to a linear phase term in the second speckle- shear interferogram that plays the role of a spatial carrier and allows the use of spatial phase measurement methods to analyze the fringe pattern. We present the theoretical aspects of the technique as well as its experimental implementation.

Paper Details

Date Published: 30 June 1998
PDF: 7 pages
Proc. SPIE 3478, Laser Interferometry IX: Techniques and Analysis, (30 June 1998); doi: 10.1117/12.312955
Show Author Affiliations
J. L. Fernandez, Univ. de Vigo (Spain)
Antonio Fernandez, Univ. de Vigo (Spain)
Angel F. Doval, Univ. de Vigo (Spain)
Abundio Davila, Ctr. de Investigaciones en Optica, A.C. (Mexico)
Jesus Blanco-Garcia, Univ. de Vigo (Spain)
Carlos Perez-Lopez, Ctr. de Investigaciones en Optica, A.C. (Mexico)


Published in SPIE Proceedings Vol. 3478:
Laser Interferometry IX: Techniques and Analysis
Malgorzata Kujawinska; Gordon M. Brown; Mitsuo Takeda, Editor(s)

© SPIE. Terms of Use
Back to Top