Share Email Print

Proceedings Paper

Feature extraction from interferograms for phase distribution analysis
Author(s): Torsten Merz; Dietrich W. Paulus; Heinrich Niemann
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In several applications of interferogram analysis, e.g. automated nondestructive testing, it is necessary to detect irregular interference phase distributions or to compare interference phase distributions with each other. For that purpose it is useful to represent the essential information of phase distributions by characteristic features. We propose features which can be extracted both from interferograms as well as from phase distributions. For feature extraction we developed new image processing methods analyzing the local structure of gray-level images. The feature extraction is demonstrated with examples of a cantilever beam and a pressure vessel using holographic interferometry. Finally we show the use of the features for defect detection and phase distribution comparison.

Paper Details

Date Published: 30 June 1998
PDF: 11 pages
Proc. SPIE 3478, Laser Interferometry IX: Techniques and Analysis, (30 June 1998); doi: 10.1117/12.312935
Show Author Affiliations
Torsten Merz, Univ. Erlangen-Nuernberg (Germany)
Dietrich W. Paulus, Univ. Erlangen-Nuernberg (Germany)
Heinrich Niemann, Univ. Erlangen-Nuernberg (Germany)

Published in SPIE Proceedings Vol. 3478:
Laser Interferometry IX: Techniques and Analysis
Malgorzata Kujawinska; Gordon M. Brown; Mitsuo Takeda, Editor(s)

© SPIE. Terms of Use
Back to Top