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Proceedings Paper

Structural and chemical analysis of grain boundaries and tellurium precipitates in commerical Cd1-xZnxTe
Author(s): Jason R. Heffelfinger; Douglas L. Medlin; Ralph B. James
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Paper Abstract

The structure and chemistry of grain boundaries in commercial Cd1-xZnxTe, prepared by the high- pressure Bridgman technique, have been analyzed using transmission electron microscopy, scanning electron microscopy, infrared-light microscopy and visible-light microscopy. These analyses show that the grain boundaries inside the Cd1-xZnxTE materials are decorated with tellurium precipitates. Analysis of a tellurium precipitate at a grain boundary by transmission electron microscopy and selected-area electron diffraction found the precipitate to consist of a single, saucer-shaped grain. Electron diffraction from the precipitate was consistent with the trigonal phase of tellurium (space group P3,21), which is the equilibrium phase at room temperature and atmospheric pressure. This precipitate was found to be aligned with one of the adjacent CZT grains such that the tellurium (0111) planes were nearly parallel to the CZT (111) planes. High-resolution transmission electron microscopy of the Te/Cd1-xZnxTe interface showed no tertiary phase at the interface. The structures of the grain boundaries and the Te/Cd1-xZnxTe interface are discussed and related to their possible implications on Cd1-xZnxTe gamma-ray detector performance.

Paper Details

Date Published: 1 July 1998
PDF: 6 pages
Proc. SPIE 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications, (1 July 1998); doi: 10.1117/12.312902
Show Author Affiliations
Jason R. Heffelfinger, Sandia National Labs. (United States)
Douglas L. Medlin, Sandia National Labs. (United States)
Ralph B. James, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 3446:
Hard X-Ray and Gamma-Ray Detector Physics and Applications
F. Patrick Doty; Richard B. Hoover, Editor(s)

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