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Proceedings Paper

Performance of a new Schottky CdTe detector for hard x-ray spectroscopy
Author(s): Tadayuki Takahashi; Kazuyuki Hirose; Chiho Matsumoto; Kyoko Takizawa; Ryouichi Ohno; Tsutomu Ozaki; Kunishiro Mori; Yasuhiro Tomita
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Paper Abstract

We report a significant improvement of the spectral properties of a cadmium telluride (CdTe) detector. With the use of a high quality CdTe crystal, we formed a high Schottky barrier for the holes on a CdTe surface using a low work-function metal, indium. For a 2 X 2 mm2 detector with a thickness of 0.5 mm the leakage current was measured to be 0.7 nA at room temperature (20 degree(s)C) and 10 pA at -20 degree(s)C for a 400 V bias voltage. The low-leakage current of the detector allows us to operate the detector at a higher bias voltage than previous CdTe detectors. The improved charge collection efficiency and the low-leakage current leads to an energy resolution of 1.1 - 2.5 keV FWHM in the energy range 2 keV to 150 keV at 20 degree(s)C without charge loss correction electronics. We confirmed that once a high electric field of several kV/cm is applied, the Schottky CdTe has a very good energy resolution as well as sufficient stability to be used for practical applications.

Paper Details

Date Published: 1 July 1998
PDF: 9 pages
Proc. SPIE 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications, (1 July 1998); doi: 10.1117/12.312900
Show Author Affiliations
Tadayuki Takahashi, Institute of Space and Astronautical Science (Japan)
Kazuyuki Hirose, Institute of Space and Astronautical Science (Japan)
Chiho Matsumoto, Institute of Space and Astronautical Science (Japan)
Kyoko Takizawa, Institute of Space and Astronautical Science (Japan)
Ryouichi Ohno, ACROTEC/Japan Energy Corp. (Japan)
Tsutomu Ozaki, ACROTEC/Japan Energy Corp. (Japan)
Kunishiro Mori, Clear Pulse Co., Ltd. (Japan)
Yasuhiro Tomita, Hamamatsu Photonics KK (Japan)

Published in SPIE Proceedings Vol. 3446:
Hard X-Ray and Gamma-Ray Detector Physics and Applications
F. Patrick Doty; Richard B. Hoover, Editor(s)

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