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Proceedings Paper

Electron transport uniformity characterization of CdZnTe using alpha particles
Author(s): Mark S. Amman; Julie S. Lee; Paul N. Luke
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Paper Abstract

Novel electrode configurations, such as coplanar grids, have been successful in mitigating the effects of poor hole transport in CdZnTe gamma-ray detectors. However, poor material uniformity remains a major problem preventing the widespread application of such detectors in gamma-ray spectroscopy. Uniform electron transport is critical for achieving good gamma-ray detection performance in the coplanar-grid configuration. We have investigated the use of alpha-particle response as a quick and simple electron transport uniformity screening technique for material selection, and as a method to study other spectral broadening mechanisms in coplanar-grid detectors. The method consists of uniformly illuminating, with an alpha-particle source, the cathode side of the CdZnTe crystal in either a planar or a coplanar-grid detector configuration. In the planar geometry, the variation in the measured pulse height is dictated in large part by the uniformity of the electron transport. An alpha-particle spectrum that has a single sharp peak with little background indicates uniform electron transport and, consequently, that the CdZnTe crystal should result in a coplanar-grid detector with good gamma-ray detection performance. In the coplanar geometry, the measured pulse-height variation provides information on additional sources of spectral broadening. In this paper we present the results of our study to measure the correlation between these simple alpha-particle measurements and the coplanar-grid gamma-ray detector response.

Paper Details

Date Published: 1 July 1998
PDF: 12 pages
Proc. SPIE 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications, (1 July 1998); doi: 10.1117/12.312890
Show Author Affiliations
Mark S. Amman, Lawrence Berkeley National Lab. (United States)
Julie S. Lee, Lawrence Berkeley National Lab. (United States)
Paul N. Luke, Lawrence Berkeley National Lab. (United States)

Published in SPIE Proceedings Vol. 3446:
Hard X-Ray and Gamma-Ray Detector Physics and Applications
F. Patrick Doty; Richard B. Hoover, Editor(s)

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