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Proceedings Paper

Fast estimation of pulse height spectra and extraction of transport parameters for semiconductor detectors
Author(s): Bruce Andrew Brunett; James E. Toney; Tuviah E. Schlesinger; Ralph B. James
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Paper Abstract

We discuss two simple, computationally efficient methods of estimating pulse height spectra for semiconductor detectors, one based on analytical techniques and the other involving Monte Carlo simulation. The former method gives rapid insight into the impact of major material parameters on detector performance, while the latter yields reasonable realistic spectra incorporating all major effects. We use both techniques in conjunction with a simulated annealing algorithm to extract electron and hole transport parameters from measured spectra.

Paper Details

Date Published: 1 July 1998
PDF: 10 pages
Proc. SPIE 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications, (1 July 1998); doi: 10.1117/12.312887
Show Author Affiliations
Bruce Andrew Brunett, Carnegie Mellon Univ. and Sandia National Labs. (United States)
James E. Toney, Carnegie Mellon Univ. (United States)
Tuviah E. Schlesinger, Carnegie Mellon Univ. (United States)
Ralph B. James, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 3446:
Hard X-Ray and Gamma-Ray Detector Physics and Applications
F. Patrick Doty; Richard B. Hoover, Editor(s)

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